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Flaw detector Product List

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Ultrasonic Testing Device 'IS-350' for the Semiconductor Field

Evaluating the interior of semiconductor products! We are focusing on "optimizing inspections" and "building inspection know-how" for our customers. Supporting 5G products!

The ultrasonic digital imaging diagnostic device "InsightScan IS-350" is a device that evaluates the internal structure of products non-destructively and without contact using ultrasound. It can detect internal defects in electronic components, metals, and welds non-destructively. [Reasons to Choose Insight] ■ "Optimization" of inspections… We create devices tailored to your inspection target products. We accommodate various aspects such as scan size, tank depth, and selection of probes. ■ Customer support… Ultrasonic testing is a specialized technology. We assist in the training of your engineers even after delivery. We provide training after installation, new sample testing, selection of new probes, and support free of charge. We also assist when there are changes in personnel.

  • Testing Equipment and Devices

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Phased Array Flaw Detector SOCOSWIFT-PA

SOCOSWIFT-PA Phased Array Flaw Detector by Socmate Co., Ltd.

【Main Features】 The maximum number of simultaneous processing reception delay rules is 64. *16 times faster than SOCOSCAN-PA.

  • Defect Inspection Equipment

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Ultra-high-speed phased array device 'FAAST-PA'

It is possible to significantly reduce the conventional UT inspection time! Ultra-fast ultrasonic flaw detection system.

The "FAAST-PA" is a high-speed phased array flaw detector manufactured by Socomate that transmits multi-focus, multi-frequency, and multi-angle in a single shot and can receive in real-time. It is compatible with 1D probes and 2D Matrix probes, allowing for the detection of defects at various angles. Additionally, it is possible to simultaneously transmit beams from different apertures, significantly reducing inspection time. 【Features】 ■ Multi-focus: Simultaneous transmission of multiple delay laws ■ Multi-frequency: Transmission of different frequencies for each delay law ■ Multi-angle: Simultaneous transmission in multiple directions ■ Ability to simultaneously transmit beams from different apertures ■ Improved inspection speed and flexibility through combination with multi-beam *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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